|
|
-
True Non-Contact Mode
- Contact
Mode
|
- Phase Imaging
- Lateral
Force Microscopy (LFM) |
|
|
-
F-d Spectroscopy
- Spring
Constant Calibration by Thermal Method
|
- Force Modulation
Microscopy (FMM) |
|
|
-
Ultra-Low Current Conductive AFM
- Variable
Enhanced Conductive AFM
|
- Internal
Conductive AFM
- I-V Spectroscopy |
|
|
-
Electric Force Microscopy (EFM)
- Dynamic
Contact EFM (DC-EFM),
Patented by Park Systems
|
- Piezoelectric
Force Microscopy (PFM), same as DC-EFM
- Scanning Kelvin Probe Microscopy (SKPM) |
|
|
-
Scanning Capacitance Microscopy (SCM)
- Scanning Spreading Resistance Microscopy(SSRM)
|
- Scanning Tunneling Microscopy (STM)
- Scanning Tunneling Spectroscopy (STS)
|
|
|
-
Magnetic Force Microscopy (MFM) |
|
|
|
-
Nanolithography
- Nanoindentation
|
- Nanomanipulation |
|
|
-
Scanning Thermal Microscopy (SThM) |
|
Research AFM
Modes