Automated Industrial AFM for Metrology of Read/Write Heads.

     

Our Programmable Data Density feature enables faster imaging by automatically adjusting the scanning pixel density to reflect the relative size of the feature being scanned. As a result, users generate images with highly detailed regions of interest within larger macrostructures, all in one scan. In addition, our crosstalk eliminated (XE) scan system and True Non-Contact Mode¢â allow for truly flat scans while simultaneously prolonging high resolution scans and tip life.