Problem

The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate 10x increase in throughput for defect review in an automated process when compared with other methods of defect review.

Park Systems Solution

Benefit

Problem

Park Systems XE-HDM is an automatic defect review AFM that revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed.

Park Systems Solution

Benefit

Problem

Researchers in hard disk media and substrate companies need to identify defects that are so small that they are time consuming for conventional tools to find and image. Hence, manual process of searching and finding defects severely constrains one’s measurement throughput.

Park Systems Solution

Benefit