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Critical Roughness Metrology
Undercut Structures and Sidewall Roughness
Etched Silicon Structures
AFM Metrology Considerations of Hard Disk Manufacturing
Programmable Data Density (PDD) for High Throughput Feature Measurement
New 3D-AFM for High Resolution Sidewall Imaging
Automatic Defect Review AFM for Hard Disk Media and Substrates
Patterned Arrays of Magnetic Nanostructures

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New 3D-AFM for High Resolution Sidewall Imaging
Etched Silicon Structures
Critical Roughness Metrology
Solar Cells
High Aspect Ratio Structure
Critical Dimension Measurement of High Aspect Ratio Trench with XE AFM
Chemical Mechanical Polishing (CMP) Metrology with Advanced AFM Surface Profiler

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Polymer Composite
Phase Separation in the Co-Extruded Polymer
Green Chemical Polymer

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Single Strand DNA Molecules
DNA Oligonucleotides
Embryonic Stem Cell
Phase Separation in the Co-Extruded Polymer
Mouse Sperm Cells
Liposomes and Vesicles
Lipid Vesicle and Bilayer
Human Astrocytoma Cells
AFM and Confocal Microscopy

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Hard-tip, Soft-spring Lithography
Atomic Force Microscopy and Raman Spectroscopy
Atomic Force Microscopy Investigation of 1D Structures Utilizing the XE-series Instruments
Characterization of Epitaxially Grown MnAs Films Using AFM and MFM
Characterization of Organic Photovoltaic Cells
Critical Roughness Metrology
Graphene (Step Height)
Graphene Membrane/Graphite
Nanoparticles/Nanotubes
Patterned Arrays of Magnetic Nanostructures
Production and Measurement of Nanodot Array
Quantum Dots/Photonic Devices
Single Crystal Yttrium Iron Garnet (YIG)
Solar Cells
Surface Morphology of Electrospun Fibers
Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green Light Emitting Diode
Thin Film - ZnO
Thin Films Nanolithography (XEL)