Park Systems serves its customers worldwide with advanced atomic force microscopes and global service and support with direct offices in Korea, Japan, Singapore, and the United States. For over 25 years, Park Systems has developed a reputation as the AFM technology leader among worldwide major universities, research institutes and industry leaders who demand the very best precision metrology solutions for the most challenging problems in their fields.     1989 : WorldĄŻs First Commercial AFM (Park Scientific Instruments)     1992 : Closed-Loop Scanner (Park Scientific Instruments)     2002 : Crosstalk Eliminated (XE) AFM for Flat and Linear XY Scan     2004 : True Non-Contact Mode for Non-destructive Sample Scan     2008 : XE-3DM, New 3D AFM, for High Resolution Sidewall Imaging     2009: XE-Bio, New Bio AFM for Live Cell Imaging with Ion Conductance Microscopy (ICM)