Company
Introduction
Company Profile
Partnership
Careers
Atomic Force Microscope

 È¸»ç °³¿ä

¿øÀÚÇö¹Ì°æ(Atomic Force Microscope)Àº ³ª³ë±â¼ú¹ßÀüÀ» ÁÖµµÇϰí Àִ ÷´Ü°èÃøÀåºñÀ̸ç, ¿¬±¸ÇöÀå°ú »ê¾÷Àü¼±¿¡¼­ ±× Á߿伺ÀÌ Áö¼ÓÀûÀ¸·Î Áõ´ëµÇ°í ÀÖ½À´Ï´Ù. ¢ßÆÄÅ©½Ã½ºÅÛ½º´Â ¼¼°è Á¤»óÀÇ ±â¼úÀ» º¸À¯ÇÑ ¿øÀÚÇö¹Ì°æ(Atomic Force Microscope)À» °³¹ß, Á¦ÀÛ, ÆÇ¸ÅÇÏ´Â º¥Ã³±â¾÷À¸·Î Àü·® ¼öÀÔ¿¡ ÀÇÁ¸ÇÏ´ø Á¤¹Ð°èÃø ¹× ³ª³ë¿µ»ó ±â±â ±¹»êÈ­¿¡ ¼º°øÇÑ ´ëÇ¥Àû ±â¾÷ÀÔ´Ï´Ù. ¢ßÆÄÅ©½Ã½ºÅÛ½º¿¡¼­ °³¹ßÇÑ decoupled XY & Z flexure scanner¸¦ ÀÌ¿ëÇÑ XE-series ¿øÀÚÇö¹Ì°æÀº ¼ø¼ö ±¹³» AFM ¿øÃµ±â¼úÀ» ±â¹ÝÀ¸·Î ÇÑ Çõ½ÅÀûÀÎ µðÀÚÀÎÀ¸·Î AFM À̹ÌÁöÀÇ ÀçÇö¼ºÀº ¹°·Ð Á÷±³¼º, ¼±Çü¼º µîÀÌ Å¹¿ùÇØ ³ª³ë ½ºÄÉÀÏ¿¡¼­ Á¤È®ÇÑ Dimension ÃøÁ¤°ú ºñÁ¢ÃË À̹ÌÁö ÃøÁ¤ÀÌ °¡´ÉÇÏ¿© Žħ°ú ½Ã·áÀÇ ¼Õ»ó ¾øÀÌ ÃÖ°íÀÇ ºÐÇØ´ÉÀ» °¡Áö°í ÀÖ½À´Ï´Ù. ±âÁ¸ Á¦Ç°¿¡ ºñÇØ ¼º´ÉÀÌ ¿ùµîÇÑ XE-series ¿øÀÚÇö¹Ì°æ ±â¼úÀº ¼ö Â÷·Ê ±¹³»¿Ü ƯÇ㸦 ȹµæÇßÀ¸¸ç, ¸¹Àº ¼ö»ó°ú ÀÎÁõÀ» ÅëÇØ ±× ¿ì¼ö¼ºÀ» ÀÎÁ¤ ¹Þ¾Æ Àü¼¼°è·ÎºÎÅÍ ÁÖ¸ñ ¹Þ°í ÀÖ½À´Ï´Ù.
¼ö»ó½ÇÀû
Gold Prize award at nano tech 2003
»ê¾÷±â¼úÇõ½Å´ë»ó
IR52 À念½Ç»ó
2004 ´ëÇѹα¹ 10´ë ½Å±â¼ú»ó
Á¤Áø±â¾ð·Ð¹®È­»ó
öž»ê¾÷ÈÆÀå
´à°í ½Í°í µÇ°í ½ÍÀº °úÇбâ¼úÀÎ
¼¼°èÀÏ·ù»óǰÀÎÁõ¼­

Atomic Force Microscope
Copyright © 2008 Park Systems Corp. All Rights Reserved.
Contact us | Site IndexRegister | Home