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Atomic Force Microscope

 Introduction

25-Year History in AFMs


The root of Park Systems can be found at Stanford University, the birthplace of Atomic Force Microscope (AFM). Dr. Sang-il Park, Chairman and CEO of Park Systems, and Dr. Sung Park, VP and General Manager of the US Headquarters, were graduate students of applied physics at the university, working in the very group that invented the AFM. Later they became the original founders of Park Scientific Instruments and developed the world¡¯s first commercial AFM in 1989.

The spin-off company (PSIA) was renamed Park Systems in 2007. After 20 years of continuous growth, Park Systems has developed global sales network over 26 countries and the company currently has more than 700 customers of its new product line, the XE-series, around the world.


History of AFM Industry



  1988 - Park Scientific Instruments (PSI) founded in Palo Alto, CA, USA.

  1989 - Universal, the world¡¯s first commercial AFM, introduced.

  1992 - Introduction of Closed-Loop Scanner

  1993 - CP, the best selling commercial AFM, introduced.

  1997 - PSI acquired by Thermo Spectra.
             PSIA founded in strategic alliance with Thermo Spectra to develop next generation AFM.

  1998 - Veeco acquisition of Digital Instruments.

  1999 - Thermo Spectra acquisition of TopoMetrix and merger with PSI into Thermo Microscopes.

  2001 - Veeco acquisition of Thermo Microscopes.

  2002 - Alliance between PSIA and Thermo Microscopes terminated.
             Introduction of Crosstalk Eliminated (XE) AFM for flat and linear XY scan with decoupled XY and Z scanners
             XE-100, PSIA¡¯s flagship next generation AFM, introduced

  2003 - XE-150, XE-AFM with full 150mm traveling stage, introduced.

  2004 - Introduction of True Non-Contact Mode for non-destructive sample scan

  2006 - XE-PTR, automated industrial AFM for metrology of read/write heads, introduced.

  2007 - PSIA renamed Park Systems.

  2008 - XE-3DM, new 3D AFM for high resolution 3D metrology, introduced

  2009 - XE-Bio, new bio AFM for live cell imaging with Ion Conductance Microscopy (ICM), introduced
             XE-HDM, automatic defect review AFM for hard disk media and substrates, introduced



Evolution of Commercial AFM Technology Driven by Park Systems

 

Atomic Force Microscope
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