 AFM Buyer's Guide |
| How AFM Works |
| How to Evaluate an AFM |
| True Non-Contact Mode |
| Standard Imaging Modes |
| Advanced SPM Modes |
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Advanced
SPM Modes| Standard Imaging Modes |
True Non-Contact ModeTM
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Phase Imaging & Phase Detection Microscopy (PDM)
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Lateral Force Microscopy (LFM)
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Basic Contact AFM and Dynamic Force Microscopy (DFM)
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| Chemical Properties |
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Chemical Force Microscopy (CFM) with Functionalized Tip
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Electrochemical Microscopy (EC-AFM, EC-STM)
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| Dielectric/Piezoelectric Properties |
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Dynamic Contact EFM (DC-EFM)
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Electrostatic Force Microscopy (EFM)
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Piezoelectric Force Microscopy (PFM)
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Piezoelectric Response Spectroscopy
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Scanning Kelvin Probe Microscopy (SKPM)
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| Force Measurement |
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Force Volume Imaging
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Force-Distance Spectroscopy
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Spring Constant Calibration by Thermal Method
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| Electrical Properties |
| In-liquid Imaging |
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Ion Conductance Microscopy (ICM)
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Live Cell Imaging
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| Magnetic Properties |
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Magnetic Force Microscopy (MFM)
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Tunable Magnetic Field MFM (TM-MFM)
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| Mechanical Properties |
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Force Modulation Microscopy (FMM)
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Nanoindentation
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Nanolithography
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| Optical Properties |
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Aperture NSOM
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Apertureless NSOM
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Tip-Enhanced Raman Spectroscopy (TERS)
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| Thermal Properties |
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Scanning Thermal Microscopy (SThM)
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