| Park
Systems serves its customers worldwide with advanced atomic
force microscopes and global service and support with direct
offices in Korea, Japan, Singapore, and the United States.
For over 25 years, Park Systems has developed a reputation
as
the AFM technology leader and preferred nanotechnology solutions partner for demanding nanoscale research and industrial measurements, among major
universities, research institutes and industry leaders who
demand the very best precision metrology solutions for the
most challenging problems in their fields. |
1989 : The World's First Commercial AFM (Park
Scientific Instruments)
1992 : Closed-Loop Scanner (Park Scientific
Instruments)
2002 : Crosstalk
Eliminated (XE) AFM for Flat and Linear XY Scan
2004 : True
Non-Contact ModeTM
for Non-destructive Sample Scan
2008 : XE-3DM,
New 3D AFM for High Resolution 3D Metrology
2009 : XE-Bio,
New Bio AFM for Live Cell Imaging with Ion Conductance Microscopy
(ICM) |
