The True Sample TopographyTM of Park Systems enables the recording of accurate heights of sample surface features even during high-speed scanning without any need for frequent and cumbersome recalibration. The True Sample TopographyTM removes the effects of edge overshoot or piezo creep error, which can only be corrected by independent position sensors, whose noise level is low enough to be used as the Topography signal. The True Sample TopographyTM utilizes advanced XYZ closed-loop scanning based on industry-leading low-noise Z position sensor to provide AFM industry's best topography.
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Sample Topography Measured by Low Noise Z Detector
Z detector noise is low enough to replace the applied voltage to the Z scanner as the Topography signal. The Z detector signal provides correct scanner positions during high speed scans, resulting in True Sample TopographyTM free of piezo creep.
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Minimum Forward and Backward Scan Gap |
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increased its measurement precision by improving its low-noise closed-loop
scan, dramatically reducing its XY scanner ringing. This is accomplished
by forward sine-scan algorithm and the forward and backward scan
gap of less than 0.15%.
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The True Sample TopographyTM together with
Crosstalk EliminationTM and True Non-Contact ModeTM, the key AFM technologies
innovated by Park Systems, makes Park's AFM the most accurate and
reliable atomic force microscope in the market.
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AFM
Technology 
True
Sample Topography
Z closed-loop detector noise of 0.02 nm
