AFM Applications - Park Systems Atomic Force Microscope, AFM, SPM, technology, Application Notes

AFM Technology

Application Notes

Biological Science

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AFM and Confocal Microscopy >>

DNA Oligonucleotides >>

Embryonic Stem Cell >>

Human Astrocytoma Cells >>

Lipid Vesicle and Bilayer >>

Liposomes and Vesicles >>

Mouse Sperm Cells >>

Phase Separation in the Co-Extruded Polymer >>

Scanning Ion Conductance Microscopy (SICM) of Collagen Fibrils >>

Single Strand DNA Molecules >>

Materials Science

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Hard-tip, Soft-spring Lithography >>

AlGaN/GaN HEMT Reliability >>

Atomic Force Microscopy and Raman Spectroscopy >>

Atomic Force Microscopy Investigation of 1D Structures Utilizing the XE-series Instruments >>

Characterization of Epitaxially Grown MnAs Films Using AFM and MFM >>

Characterization of Organic Photovoltaic Cells >>

Critical Roughness Metrology >>

Graphene (Step Height) >>

Graphene Membrane/Graphite >>

Nanoparticles/Nanotubes >>

Nanoscale Surface Photovoltage >>

Patterned Arrays of Magnetic Nanostructures >>

Production and Measurement of Nanodot Array >>

Quantum Dots/Photonic Devices >>

Single Crystal Yttrium Iron Garnet (YIG) >>

Solar Cells >>

SrTiO₃ Surfaces by Using Park Systems XE-70 AFM >>

Surface Morphology of Electrospun Fibers >>

Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green Light Emitting Diode >>

Thin Film - ZnO >>

Thin Films Nanolithography (XEL) >>

Zinc Oxide Surfaces >>

Polymer Science

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Cross-section of Polymer Film >>

Green Chemical Polymer >>

Phase Separation in the Co-Extruded Polymer >>

Polymer Composite >>

Data Storage

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Three-Dimensional Imaging of Undercut and Sidewall Structures by Atomic Force Microscopy >>

AFM Metrology Considerations of Hard Disk Manufacturing >>

Automatic Defect Review AFM for Hard Disk Media and Substrates >>

Critical Roughness Metrology >>

Etched Silicon Structures >>

New 3D-AFM for High Resolution Sidewall Imaging >>

Patterned Arrays of Magnetic Nanostructures >>

Programmable Data Density (PDD) for High Throughput Feature Measurement >>

Undercut Structures and Sidewall Roughness >>

Semiconductors

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Three-Dimensional Imaging of Undercut and Sidewall Structures by Atomic Force Microscopy >>

Chemical Mechanical Polishing (CMP) Metrology with Advanced AFM Surface Profiler >>

Critical Dimension Measurement of High Aspect Ratio Trench with XE AFM >>

Critical Roughness Metrology >>

Etched Silicon Structures >>

High Aspect Ratio Structure >>

New 3-Dimensional AFM for CD Measurement and Sidewall Characterization >>

New 3D-AFM for High Resolution Sidewall Imaging >>

Solar Cells >>