The Nanotechnology
Solutions Partner
The quality of your data is critical to gaining research
credibility and production yield. The key to quality results
is data accuracy at the nanoscale. Park Systems developed
the world’s first commercial AFM in 1989, opening up a new
world of research and development. The company continues
its pioneering leadership with breakthrough technology for
nanoscale
imaging and data accuracy. As the
nanotechnology solutions partner for
research and industry, we also offer innovations in system
design, quality control, and service that provide
the lowest AFM lifecycle cost
available. The result is a total solution for a new generation
of researchers and engineers who need a leading-edge AFM
that meets their budget, data accuracy, and productivity
needs. |
1989 : The World's First Commercial
AFM (Park Scientific Instruments)
1992 : Closed-Loop Scanner (Park Scientific
Instruments)
2002 : Crosstalk
Eliminated (XE) AFM for Flat and Linear XY Scan
2004 : True
Non-Contact ModeTM
for Non-destructive Sample Scan
2008 : XE-3DM,
New 3D AFM for High Resolution 3D Metrology
2009 : XE-Bio,
New Bio AFM for Live Cell Imaging with Ion Conductance Microscopy
(ICM)
2011 : NX10,
Flagship AFM of New Product Line with True
Sample TopographyTM |
Atomic Force Microscope
Industrial AFM
|
|
|
|
XE-PTR
Automated Industrial AFM for Metrology of Read/Write Heads
 |
Our Programmable Data Density feature enables
faster imaging by automatically adjusting the scanning pixel
density to reflect the relative size of the feature being
scanned. As a result, users generate images with highly
detailed regions of interest within larger macrostructures...
+more |
|
XE-3DM
Automated Industrial AFM for High-Resolution 3D Metrology
|
Park Systems provides a reference metrology
system for the critical dimension and sidewall analysis.
As a fully automated AFM system, the 3DM allows for sidewall,
undercut, and line/trench width characterization. With our
True Non-Contact Mode™, our XE-3DM is capable of imaging
the most challenging structures such as soft photoresists
and 3D multilayer topologies. +more |
|
XE-LCD
Automated Industrial AFM for In-line Flat Panel Inspection and Metrology
|
Atomic Force Microscopy (AFM) is emerging
as an essential tool in many industries. With its ability
to accurately measure critical dimensions in the micrometer
to nanometer regime, the AFM is becoming an essential tool
choice in flat panel applications such as surface roughness,
channel height and width measurement, and column/pitch spacer
characterization... +more |
|
Atomic Force Microscope
Research AFM
|
|
|
|
XE-Bio
Single Live Cell Imaging and Ion Conductance Microscopy
|
XE-Bio is a powerful 3-in-1 nanoscience research
tool that uniquely combines industry’s only True Non-Contact
AFM with Ion Conductance Microscopy (ICM) and inverted optical
microscope on the same platform. The modular design of the
XE-Bio allows easy exchange between non-contact .. +more |
|
XE-70
Affordable, Research-Grade AFM with Flexible Sample Handling
|
XE-70 is Park Systems’ AFM solution for
researchers with limited budget. XE-70 does not compromise
any of the innovative technologies of the XE-series that
sets it apart from conventional AFMs, supporting the same
modes, options, and electronics as all other systems in
the XE product line.+more |
|
|
Data accuracy is of paramount importance
to nanotechnology researchers as the credibility of their
research depends upon accurate results. The NX10, the world’s
most accurate AFM, is the flagship AFM of Park Systems’
new product line. The NX10 brings unparalleled imaging accuracy...
+more |
|
XE-120
For Combined Capability of XE-AFM and Inverted Optical Microscope
|
Take the award-winning XE-100, shrink it
such that it can be placed on top of the many popular inverted
optical microscopes, and you have the versatile XE-120,
an exceptional AFM with expanded sample and interactivity
flexibility. The XE-120 is the research grade AFM with industry’s
only True Non-Contact modeTM imaging for both air and liquid
imaging.+more |
|
XE-150
Premier Cross-Functional AFM with Motorized Sample Stage
|
With the arrival of the XE-150, Park Systems’
large sample AFM, Non-Contact AFM imaging has become the
most feasible and practical way to scan your large samples
with ultimate AFM resolution and reliability. The XY motorized
sample stage is optimized for both small and large sample
placement, 150 mm × 150 mm, and allows full travel over
the entire sample... +more |
|
|
|
|
