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    Park
    SmartScanTM
    Park AFM Operating Software
    Easy & Powerful
    Simple Three-Step Process.
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  • NX10-AFM-main
    Park NX10The quickest path to innovative researchnx10Read More
  • NX20-AFM-main
    Park NX20The premiere choice for failure analysis
    and large sample research
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    Park NX-WaferAutomated Industrial AFM
    for In-line Wafer Inspection and Metrology
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  • nx-hdm AFM
    Park NX-HDM Simply the best AFM for Media & Substrate Manufacturing
    • Higher Throughput, Automatic Defect Review
    • Accurate Sub-Angstrom Surface Roughness
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What is a Good AFM?

"How to Evaluate an AFM"

Park AFM Technology

The most innovative AFM technology

Park AFM Modes

The most extensive range of AFM modes
Upcoming EVENTS
  December 2 - December 4 , 2014
 

Atomic Force Microscopy